X-ray spectrometry in SEM and first row transition elements

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 1999
EventConference on Electron Microscopy and Analysis - Sheffield
Duration: 25 Aug 199927 Aug 1999

Conference

ConferenceConference on Electron Microscopy and Analysis
CitySheffield
Period25/08/9927/08/99

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Pölt, P. (1999). X-ray spectrometry in SEM and first row transition elements. Poster session presented at Conference on Electron Microscopy and Analysis, Sheffield, .

X-ray spectrometry in SEM and first row transition elements. / Pölt, Peter.

1999. Poster session presented at Conference on Electron Microscopy and Analysis, Sheffield, .

Research output: Contribution to conferencePosterResearch

Pölt, P 1999, 'X-ray spectrometry in SEM and first row transition elements' Conference on Electron Microscopy and Analysis, Sheffield, 25/08/99 - 27/08/99, .
Pölt P. X-ray spectrometry in SEM and first row transition elements. 1999. Poster session presented at Conference on Electron Microscopy and Analysis, Sheffield, .
Pölt, Peter. / X-ray spectrometry in SEM and first row transition elements. Poster session presented at Conference on Electron Microscopy and Analysis, Sheffield, .
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note = "Conference on Electron Microscopy and Analysis ; Conference date: 25-08-1999 Through 27-08-1999",

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TY - CONF

T1 - X-ray spectrometry in SEM and first row transition elements

AU - Pölt, Peter

PY - 1999

Y1 - 1999

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