Trust Management Through Hardware Means: Design Concerns and Optimizations

Apostolos P. Fournaris, Daniel Hein

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Original languageEnglish
Title of host publicationVLSI 2010 Annual Symposium
Place of PublicationNiederlande
PublisherSpringer Netherlands
Pages31-45
Volume105
Edition1
ISBN (Print)978-94-007-1487-8
DOIs
Publication statusPublished - 2011

Publication series

NameLecture Notes in Electrical Engineering
PublisherSpringer Netherlands

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Fournaris, A. P., & Hein, D. (2011). Trust Management Through Hardware Means: Design Concerns and Optimizations. In VLSI 2010 Annual Symposium (1 ed., Vol. 105, pp. 31-45). (Lecture Notes in Electrical Engineering). Niederlande: Springer Netherlands. https://doi.org/10.1007/978-94-007-1488-5_3

Trust Management Through Hardware Means: Design Concerns and Optimizations. / Fournaris, Apostolos P.; Hein, Daniel.

VLSI 2010 Annual Symposium. Vol. 105 1. ed. Niederlande : Springer Netherlands, 2011. p. 31-45 (Lecture Notes in Electrical Engineering).

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Fournaris, AP & Hein, D 2011, Trust Management Through Hardware Means: Design Concerns and Optimizations. in VLSI 2010 Annual Symposium. 1 edn, vol. 105, Lecture Notes in Electrical Engineering, Springer Netherlands, Niederlande, pp. 31-45. https://doi.org/10.1007/978-94-007-1488-5_3
Fournaris AP, Hein D. Trust Management Through Hardware Means: Design Concerns and Optimizations. In VLSI 2010 Annual Symposium. 1 ed. Vol. 105. Niederlande: Springer Netherlands. 2011. p. 31-45. (Lecture Notes in Electrical Engineering). https://doi.org/10.1007/978-94-007-1488-5_3
Fournaris, Apostolos P. ; Hein, Daniel. / Trust Management Through Hardware Means: Design Concerns and Optimizations. VLSI 2010 Annual Symposium. Vol. 105 1. ed. Niederlande : Springer Netherlands, 2011. pp. 31-45 (Lecture Notes in Electrical Engineering).
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