The gas supply function in the field ion microscope

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)L271-L274
JournalSurface science
Volume95
Publication statusPublished - 1980

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

The gas supply function in the field ion microscope. / Rendulic, Klaus; Leisch, Manfred.

In: Surface science, Vol. 95, 1980, p. L271-L274.

Research output: Contribution to journalArticleResearchpeer-review

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title = "The gas supply function in the field ion microscope",
author = "Klaus Rendulic and Manfred Leisch",
year = "1980",
language = "English",
volume = "95",
pages = "L271--L274",
journal = "Surface science",
issn = "0039-6028",
publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - The gas supply function in the field ion microscope

AU - Rendulic, Klaus

AU - Leisch, Manfred

PY - 1980

Y1 - 1980

M3 - Article

VL - 95

SP - L271-L274

JO - Surface science

JF - Surface science

SN - 0039-6028

ER -