Structural and magnetic characterization of Ni-filled porous silicon

K. Rumpf, P. Granitzer, Peter Pölt, Angelika Reichmann, H. Krenn

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)716-720
JournalThin solid films
Volume515
Issue number2
DOIs
Publication statusPublished - 2006

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Structural and magnetic characterization of Ni-filled porous silicon. / Rumpf, K.; Granitzer, P.; Pölt, Peter; Reichmann, Angelika; Krenn, H.

In: Thin solid films, Vol. 515, No. 2, 2006, p. 716-720.

Research output: Contribution to journalArticleResearchpeer-review

Rumpf, K. ; Granitzer, P. ; Pölt, Peter ; Reichmann, Angelika ; Krenn, H. / Structural and magnetic characterization of Ni-filled porous silicon. In: Thin solid films. 2006 ; Vol. 515, No. 2. pp. 716-720.
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