| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 33rd International Workshop on Statistical Modelling |
| Subtitle of host publication | 15th-20th July 2018, Bristol UK |
| Publisher | University of Bristol |
| Pages | 151-156 |
| Number of pages | 6 |
| Volume | 1 |
| Publication status | Published - 2018 |
| Event | 33rd International Workshop on Statistical Modelling - Bristol, United Kingdom Duration: 15 Jul 2018 → 20 Jul 2018 |
Conference
| Conference | 33rd International Workshop on Statistical Modelling |
|---|---|
| Abbreviated title | IWSM 2018 |
| Country | United Kingdom |
| City | Bristol |
| Period | 15/07/18 → 20/07/18 |
Cite this
Karasek, S., Friedl, H., & Scheibelhofer, P. (2018). Statistical Analysis of Semiconductor Images. In Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK (Vol. 1, pp. 151-156). University of Bristol.
Statistical Analysis of Semiconductor Images. / Karasek, Sarah; Friedl, Herwig; Scheibelhofer, Peter.
Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. Vol. 1 University of Bristol, 2018. p. 151-156.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Karasek, S, Friedl, H & Scheibelhofer, P 2018, Statistical Analysis of Semiconductor Images. in Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. vol. 1, University of Bristol, pp. 151-156, 33rd International Workshop on Statistical Modelling, Bristol, United Kingdom, 15/07/18.
Karasek S, Friedl H, Scheibelhofer P. Statistical Analysis of Semiconductor Images. In Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. Vol. 1. University of Bristol. 2018. p. 151-156
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title = "Statistical Analysis of Semiconductor Images",
author = "Sarah Karasek and Herwig Friedl and Peter Scheibelhofer",
year = "2018",
language = "English",
volume = "1",
pages = "151--156",
booktitle = "Proceedings of the 33rd International Workshop on Statistical Modelling",
publisher = "University of Bristol",
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}
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T1 - Statistical Analysis of Semiconductor Images
AU - Karasek, Sarah
AU - Friedl, Herwig
AU - Scheibelhofer, Peter
PY - 2018
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VL - 1
SP - 151
EP - 156
BT - Proceedings of the 33rd International Workshop on Statistical Modelling
PB - University of Bristol
ER -