Statistical Analysis of Semiconductor Images

Sarah Karasek, Herwig Friedl, Peter Scheibelhofer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LanguageEnglish
Title of host publicationProceedings of the 33rd International Workshop on Statistical Modelling
Subtitle of host publication15th-20th July 2018, Bristol UK
PublisherUniversity of Bristol
Pages151-156
Number of pages6
Volume1
StatusPublished - 2018
Event33rd International Workshop on Statistical Modelling - Bristol, United Kingdom
Duration: 15 Jul 201820 Jul 2018

Conference

Conference33rd International Workshop on Statistical Modelling
Abbreviated titleIWSM 2018
CountryUnited Kingdom
CityBristol
Period15/07/1820/07/18

Cite this

Karasek, S., Friedl, H., & Scheibelhofer, P. (2018). Statistical Analysis of Semiconductor Images. In Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK (Vol. 1, pp. 151-156). University of Bristol.

Statistical Analysis of Semiconductor Images. / Karasek, Sarah; Friedl, Herwig; Scheibelhofer, Peter.

Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. Vol. 1 University of Bristol, 2018. p. 151-156.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Karasek, S, Friedl, H & Scheibelhofer, P 2018, Statistical Analysis of Semiconductor Images. in Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. vol. 1, University of Bristol, pp. 151-156, 33rd International Workshop on Statistical Modelling, Bristol, United Kingdom, 15/07/18.
Karasek S, Friedl H, Scheibelhofer P. Statistical Analysis of Semiconductor Images. In Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. Vol. 1. University of Bristol. 2018. p. 151-156.
Karasek, Sarah ; Friedl, Herwig ; Scheibelhofer, Peter. / Statistical Analysis of Semiconductor Images. Proceedings of the 33rd International Workshop on Statistical Modelling : 15th-20th July 2018, Bristol UK. Vol. 1 University of Bristol, 2018. pp. 151-156
@inproceedings{38805b3b5fd7493fb2f8bfacedd31d50,
title = "Statistical Analysis of Semiconductor Images",
author = "Sarah Karasek and Herwig Friedl and Peter Scheibelhofer",
year = "2018",
language = "English",
volume = "1",
pages = "151--156",
booktitle = "Proceedings of the 33rd International Workshop on Statistical Modelling",
publisher = "University of Bristol",
address = "United Kingdom",

}

TY - GEN

T1 - Statistical Analysis of Semiconductor Images

AU - Karasek,Sarah

AU - Friedl,Herwig

AU - Scheibelhofer,Peter

PY - 2018

Y1 - 2018

M3 - Conference contribution

VL - 1

SP - 151

EP - 156

BT - Proceedings of the 33rd International Workshop on Statistical Modelling

PB - University of Bristol

ER -