Statistical Analysis of Semiconductor Images

Sarah Karasek, Herwig Friedl, Peter Scheibelhofer

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 33rd International Workshop on Statistical Modelling
Subtitle of host publication	15th-20th July 2018, Bristol UK
Publisher	University of Bristol
Pages	151-156
Number of pages	6
Volume	1
Publication status	Published - 2018
Event	33rd International Workshop on Statistical Modelling - Bristol, United Kingdom Duration: 15 Jul 2018 → 20 Jul 2018

Conference	33rd International Workshop on Statistical Modelling
Abbreviated title	IWSM 2018
Country/Territory	United Kingdom
City	Bristol
Period	15/07/18 → 20/07/18

Cite this

@inproceedings{38805b3b5fd7493fb2f8bfacedd31d50,

title = "Statistical Analysis of Semiconductor Images",

author = "Sarah Karasek and Herwig Friedl and Peter Scheibelhofer",

year = "2018",

language = "English",

volume = "1",

pages = "151--156",

booktitle = "Proceedings of the 33rd International Workshop on Statistical Modelling",

publisher = "University of Bristol",

address = "United Kingdom",

note = "33rd International Workshop on Statistical Modelling, IWSM 2018 ; Conference date: 15-07-2018 Through 20-07-2018",

}

TY - GEN

T1 - Statistical Analysis of Semiconductor Images

AU - Karasek, Sarah

AU - Friedl, Herwig

AU - Scheibelhofer, Peter

PY - 2018

Y1 - 2018

M3 - Conference paper

VL - 1

SP - 151

EP - 156

BT - Proceedings of the 33rd International Workshop on Statistical Modelling

PB - University of Bristol

T2 - 33rd International Workshop on Statistical Modelling

Y2 - 15 July 2018 through 20 July 2018

ER -