Statistical Analysis of Semiconductor Images

Sarah Karasek, Herwig Friedl, Peter Scheibelhofer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 33rd International Workshop on Statistical Modelling
Subtitle of host publication15th-20th July 2018, Bristol UK
PublisherUniversity of Bristol
Pages151-156
Number of pages6
Volume1
Publication statusPublished - 2018
Event33rd International Workshop on Statistical Modelling - Bristol, United Kingdom
Duration: 15 Jul 201820 Jul 2018

Conference

Conference33rd International Workshop on Statistical Modelling
Abbreviated titleIWSM 2018
CountryUnited Kingdom
CityBristol
Period15/07/1820/07/18

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