Scalable Multitasking Dynamic Pulse Based Reliability Stress Test for High Voltage Discrete Semiconductors

Konstantinos Patmanidis, Michael Glavanovics, Annette Muetze

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

High voltage power electronic devices undergo various stressors in their application environment, leading to long-term degradation and final catastrophic failure. This accumulated damage needs to be investigated during the development phase, as well as its impact on the device long-term performance. Therefore, power semiconductors should be subjected to repetitive stress testing in order to study the aging mechanisms as well as potential unknown failures before commercializing. Additionally, owing to manufacturing process variations and material tolerances, it is imperative to stress a sufficient number of devices for a meaningful statistical analysis. Taking into account these facts, this paper introduces a scalable reliability stress test system that covers various dynamic pulse stress scenarios, such as short circuit (SC), unclamped inductive switching (UIS) and double pulse testing (DPT), while assuring its robustness under worst-case conditions.

Original languageEnglish
Title of host publication2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9789075815375
Publication statusPublished - 6 Sep 2021
Event23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe - Ghent, Belgium
Duration: 6 Sep 202110 Sep 2021

Publication series

Name2021 23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe

Conference

Conference23rd European Conference on Power Electronics and Applications, EPE 2021 ECCE Europe
Country/TerritoryBelgium
CityGhent
Period6/09/2110/09/21

Keywords

  • Discrete power device
  • Double pulse test
  • Parallel operation
  • Pulsed Current
  • Reliability

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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