Modular dynamic pulse stress test system for discrete high power semiconductors

K. Patmanidis*, M. Glavanovics, A. Georgakas, A. Muetze

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Modular dynamic pulse stress test system for discrete high power semiconductors'. Together they form a unique fingerprint.

Engineering