Modelling of AFM-SECM tips: influence of defects and geometry on limiting current for approach curves and images

Kelly Leonhardt, Guy Denuault, Bernhard Gollas

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 3 Oct 2010
Event6th Workshop on Scanning Electrochemical Microscopy - Frejus, France
Duration: 3 Oct 20107 Oct 2010

Conference

Conference6th Workshop on Scanning Electrochemical Microscopy
CountryFrance
CityFrejus
Period3/10/107/10/10

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical

Cite this

Leonhardt, K., Denuault, G., & Gollas, B. (2010). Modelling of AFM-SECM tips: influence of defects and geometry on limiting current for approach curves and images. 6th Workshop on Scanning Electrochemical Microscopy, Frejus, France.