Modelling of AFM-SECM tips: influence of defects and geometry on limiting current for approach curves and images

Kelly Leonhardt, Guy Denuault, Bernhard Gollas

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 3 Oct 2010
Event	6th Workshop on Scanning Electrochemical Microscopy - Frejus, France Duration: 3 Oct 2010 → 7 Oct 2010

Conference	6th Workshop on Scanning Electrochemical Microscopy
Country/Territory	France
City	Frejus
Period	3/10/10 → 7/10/10

Fields of Expertise

@conference{0174d195da2c41b1b125ad4f309d87da,

title = "Modelling of AFM-SECM tips: influence of defects and geometry on limiting current for approach curves and images",

author = "Kelly Leonhardt and Guy Denuault and Bernhard Gollas",

year = "2010",

month = oct,

day = "3",

language = "English",

note = "6th Workshop on Scanning Electrochemical Microscopy ; Conference date: 03-10-2010 Through 07-10-2010",

}