Merging dielectric stability and ubiquitous adhesion: Poly(2-oxazoline)s in microelectronics and high voltage engineering

Frank Wiesbrock, Alexander Eibel, Philipp Marx, Robin Hofmann

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Article numberPOLY-0152
Number of pages1
JournalAbstracts of papers / American Chemical Society
Volume2019
Issue number257
Publication statusPublished - Apr 2019

Fields of Expertise

  • Advanced Materials Science

Cooperations

  • NAWI Graz

Cite this

Merging dielectric stability and ubiquitous adhesion: Poly(2-oxazoline)s in microelectronics and high voltage engineering. / Wiesbrock, Frank; Eibel, Alexander; Marx, Philipp; Hofmann, Robin.

In: Abstracts of papers / American Chemical Society, Vol. 2019, No. 257, POLY-0152, 04.2019.

Research output: Contribution to journalArticleResearchpeer-review

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title = "Merging dielectric stability and ubiquitous adhesion: Poly(2-oxazoline)s in microelectronics and high voltage engineering",
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journal = "Abstracts of papers / American Chemical Society",
issn = "0065-7727",
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AU - Wiesbrock, Frank

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AU - Hofmann, Robin

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JO - Abstracts of papers / American Chemical Society

JF - Abstracts of papers / American Chemical Society

SN - 0065-7727

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