Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation

Alexander Blümel, Peter Pacher, Simon Josef Außerlechner, Harald Plank, Andreas Klug, Egbert Zojer, Emil List

Research output: Contribution to conferencePosterResearch

Original languageGerman
Publication statusPublished - 2010
Event2010 MRS Spring Meeting - San Francisco, USA
Duration: 5 Apr 20109 Apr 2010

Conference

Conference2010 MRS Spring Meeting
CitySan Francisco, USA
Period5/04/109/04/10

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Blümel, A., Pacher, P., Außerlechner, S. J., Plank, H., Klug, A., Zojer, E., & List, E. (2010). Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation. Poster session presented at 2010 MRS Spring Meeting, San Francisco, USA, .

Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation. / Blümel, Alexander; Pacher, Peter; Außerlechner, Simon Josef; Plank, Harald; Klug, Andreas; Zojer, Egbert; List, Emil.

2010. Poster session presented at 2010 MRS Spring Meeting, San Francisco, USA, .

Research output: Contribution to conferencePosterResearch

Blümel, A, Pacher, P, Außerlechner, SJ, Plank, H, Klug, A, Zojer, E & List, E 2010, 'Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation' 2010 MRS Spring Meeting, San Francisco, USA, 5/04/10 - 9/04/10, .
Blümel A, Pacher P, Außerlechner SJ, Plank H, Klug A, Zojer E et al. Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation. 2010. Poster session presented at 2010 MRS Spring Meeting, San Francisco, USA, .
Blümel, Alexander ; Pacher, Peter ; Außerlechner, Simon Josef ; Plank, Harald ; Klug, Andreas ; Zojer, Egbert ; List, Emil. / Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation. Poster session presented at 2010 MRS Spring Meeting, San Francisco, USA, .
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author = "Alexander Bl{\"u}mel and Peter Pacher and Au{\ss}erlechner, {Simon Josef} and Harald Plank and Andreas Klug and Egbert Zojer and Emil List",
year = "2010",
language = "deutsch",
note = "null ; Conference date: 05-04-2010 Through 09-04-2010",

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TY - CONF

T1 - Kelvin Probe Force Microscopy (KPFM) Measurements of NH3 Sensitive Organic Field Effect Transistors (OFETs) During Operation

AU - Blümel, Alexander

AU - Pacher, Peter

AU - Außerlechner, Simon Josef

AU - Plank, Harald

AU - Klug, Andreas

AU - Zojer, Egbert

AU - List, Emil

PY - 2010

Y1 - 2010

M3 - Poster

ER -