Fundamental proximity effects for electron beam induced deposition processes

Roland Schmied, Christian Gspan, Martina Dienstleder, Stefan Michelitsch, Harald Plank

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
Pages517-518
Publication statusPublished - 2011
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Fields of Expertise

  • Mobility & Production

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmied, R., Gspan, C., Dienstleder, M., Michelitsch, S., & Plank, H. (2011). Fundamental proximity effects for electron beam induced deposition processes. In Multinational Congress on Microscopy (pp. 517-518). ..