Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied, J.D. Fowlkes, Robert Winkler, P.D. Rack, Harald Plank

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)462-471
JournalBeilstein Journal of Nanotechnology
Issue number6
DOIs
Publication statusPublished - 2015

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  • Advanced Materials Science

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Fundamental edge broadening effects during focused electron beam induced nanosynthesis. / Schmied, Roland; Fowlkes, J.D.; Winkler, Robert; Rack, P.D.; Plank, Harald.

In: Beilstein Journal of Nanotechnology , No. 6, 2015, p. 462-471.

Research output: Contribution to journalArticleResearchpeer-review

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AU - Fowlkes, J.D.

AU - Winkler, Robert

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AU - Plank, Harald

PY - 2015

Y1 - 2015

U2 - doi:10.3762/bjnano.6.47

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JF - Beilstein Journal of Nanotechnology

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