Extending analytical STEM to three dimensions: Spectral EELS and EDX tomography of an Al-Si based alloy

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2014
EventEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroup meeting on EELS & EFTEM - TU Graz
Duration: 23 Apr 201425 Apr 2014

Conference

ConferenceEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroup meeting on EELS & EFTEM
CityTU Graz
Period23/04/1425/04/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Haberfehlner, G., Albu, M., Orthacker, A., & Kothleitner, G. (2014). Extending analytical STEM to three dimensions: Spectral EELS and EDX tomography of an Al-Si based alloy. Poster session presented at European Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroup meeting on EELS & EFTEM, TU Graz, .