Efficient fault emulation based on post-injection fault effect analysis (PIFEA)

Johannes Grinschgl, Armin Krieg, Christian Steger, Reinhold Weiß, Holger Bock, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageGerman
Title of host publication55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
Publisher.
Pages526-529
StatusPublished - 2012
Event55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Boise, United States
Duration: 5 Aug 20128 Aug 2012

Conference

Conference55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)
CountryUnited States
CityBoise
Period5/08/128/08/12

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Grinschgl, J., Krieg, A., Steger, C., Weiß, R., Bock, H., & Haid, J. (2012). Efficient fault emulation based on post-injection fault effect analysis (PIFEA). In 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) (pp. 526-529). ..

Efficient fault emulation based on post-injection fault effect analysis (PIFEA). / Grinschgl, Johannes; Krieg, Armin; Steger, Christian; Weiß, Reinhold; Bock, Holger; Haid, Josef.

55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS). ., 2012. p. 526-529.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Grinschgl, J, Krieg, A, Steger, C, Weiß, R, Bock, H & Haid, J 2012, Efficient fault emulation based on post-injection fault effect analysis (PIFEA). in 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS). ., pp. 526-529, 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Boise, United States, 5/08/12.
Grinschgl J, Krieg A, Steger C, Weiß R, Bock H, Haid J. Efficient fault emulation based on post-injection fault effect analysis (PIFEA). In 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS). .2012. p. 526-529.
Grinschgl, Johannes ; Krieg, Armin ; Steger, Christian ; Weiß, Reinhold ; Bock, Holger ; Haid, Josef. / Efficient fault emulation based on post-injection fault effect analysis (PIFEA). 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS). ., 2012. pp. 526-529
@inproceedings{8d68be8f858f4f45b814ed0efa690027,
title = "Efficient fault emulation based on post-injection fault effect analysis (PIFEA)",
author = "Johannes Grinschgl and Armin Krieg and Christian Steger and Reinhold Wei{\ss} and Holger Bock and Josef Haid",
year = "2012",
language = "deutsch",
pages = "526--529",
booktitle = "55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)",
publisher = ".",

}

TY - GEN

T1 - Efficient fault emulation based on post-injection fault effect analysis (PIFEA)

AU - Grinschgl,Johannes

AU - Krieg,Armin

AU - Steger,Christian

AU - Weiß,Reinhold

AU - Bock,Holger

AU - Haid,Josef

PY - 2012

Y1 - 2012

M3 - Beitrag in einem Konferenzband

SP - 526

EP - 529

BT - 55th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

PB - .

ER -