Effect of Model Details on the predicted Saturation Profiles in condensation particle counters

Tristan Reinisch, Stefan Radl, Alexander Bergmann, Mario Schriefl, Martin Kraft

Research output: Contribution to journalArticleResearchpeer-review

Abstract

We establish an analytical model, as well as perform Computational Fluid Dynamics (CFD) simulations to investigate the evaporation-condensation process in Condensation Particle Counters (CPCs). Via a systematic analysis of the effect of geometrical and operational parameters on the saturation profile in CPCs, we unveil that the insulation in these measurement devices is of key significance for the detection efficiency. Furthermore, we demonstrate that our analytical model can reliably predict the mass fraction of working fluid in the gas phase at the outlet of the saturator. This is of key importance for the efficient screening of working fluids, as well as the optimization of both geometry and operation parameters of CPCs.
Original languageEnglish
Pages (from-to)1625-1633
Number of pages9
JournalAdvanced powder technology
Volume30
Issue number8
DOIs
Publication statusPublished - 1 Aug 2019

Fingerprint

Radiation counters
radiation counters
Condensation
condensation
saturation
working fluids
profiles
Analytical models
Fluids
outlets
computational fluid dynamics
insulation
Insulation
Screening
Computational fluid dynamics
Evaporation
screening
Gases
evaporation
vapor phases

Keywords

  • Computational fluid dynamics
  • Condensation particle counter
  • Nanoparticles
  • Saturation
  • Species transport

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Mechanics of Materials

Fields of Expertise

  • Mobility & Production

Cite this

Effect of Model Details on the predicted Saturation Profiles in condensation particle counters. / Reinisch, Tristan; Radl, Stefan; Bergmann, Alexander; Schriefl, Mario; Kraft, Martin.

In: Advanced powder technology, Vol. 30, No. 8, 01.08.2019, p. 1625-1633.

Research output: Contribution to journalArticleResearchpeer-review

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