D2R1: A 2-D X-Ray Detector for CdTe-Based Fine Pitch and High-Energy Resolution Imaging Spectroscopy

D. Baudin, S. Dubos, O. Gevin, O. Limousin, D. Maier, A. Michalowska, D. Renaud, P. Serrano, T. Takahashi, S. Watanabe

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Abstract

This paper describes a 16 × 16 pixels CdTe-based X-ray detector named dimension 2 revision 1 (D2R1) with a pixel size of 300 μ m × 300 μ m. An application-specific integrated circuit (ASIC) is interconnected to a CdTe detector by means of an indium gold stud bonding process. This ASIC has a mean equivalent noise charge of 29 el.rms (at 0 pF). The combination of a low capacitance interconnection and low-dark-current detector (0.5 pA) with an optimized ASIC results in a spectral resolution of 584-eV full-width at half-maximum at 60 keV, an energy threshold of 2 keV with a dynamic range of 250 keV. A filtering stage made of a multicorrelated double sampling allows the system to measure X-ray photons at a frequency of 10 kcounts/s typically suited for low photon flux less than 3000 photons cm-2 s-1. The energy range, resolution, and timing capability of D2R1 can suite a variety of different applications such as X-ray astrophysics, nuclear safety, or medical applications.

Original languageEnglish
Pages (from-to)1408-1415
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume65
Issue number7
DOIs
Publication statusPublished - 1 Jul 2018

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Keywords

  • Application-specific integrated circuits (ASICs)
  • CdTe
  • energy resolution
  • imaging
  • low-noise electronics
  • spectroscopy
  • X-rays

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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