Configurable gate driver for a stress test bench of newly developed discrete silicon power devices

Engineering

• Test Bench 100%
• Current Source 100%
• Power Device 100%
• Switching Speed 66%
• Application 33%
• Experiments 33%
• Performance 33%
• Gate Voltage 33%
• Open Loop 33%
• Reliability 33%
• Semiconductor 33%
• Nonlinearity 33%
• Failure Mechanism 33%
• Additional Consideration 33%
• Failure Mode 33%
• Output Impedance 33%
• Test System 33%
• Resistor 33%
• Reliability Analysis 33%
• Test Vehicle 33%
• Related Failure 33%
• Metal-Oxide-Semiconductor Field-Effect Transistor 33%