Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2014
EventInternational Microscopy Congress 2014 - Prag Tschechische Republik
Duration: 7 Sep 201412 Sep 2014

Conference

ConferenceInternational Microscopy Congress 2014
CityPrag Tschechische Republik
Period7/09/1412/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Mitsche, S., & Pölt, P. (2014). Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. Poster session presented at International Microscopy Congress 2014, Prag Tschechische Republik, .

Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. / Mitsche, Stefan; Pölt, Peter.

2014. Poster session presented at International Microscopy Congress 2014, Prag Tschechische Republik, .

Research output: Contribution to conferencePosterResearch

Mitsche, S & Pölt, P 2014, 'Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope' International Microscopy Congress 2014, Prag Tschechische Republik, 7/09/14 - 12/09/14, .
Mitsche S, Pölt P. Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. 2014. Poster session presented at International Microscopy Congress 2014, Prag Tschechische Republik, .
Mitsche, Stefan ; Pölt, Peter. / Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. Poster session presented at International Microscopy Congress 2014, Prag Tschechische Republik, .
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title = "Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope",
author = "Stefan Mitsche and Peter P{\"o}lt",
year = "2014",
language = "English",
note = "International Microscopy Congress 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

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TY - CONF

T1 - Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

AU - Mitsche, Stefan

AU - Pölt, Peter

PY - 2014

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M3 - Poster

ER -