Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the European Test Workshop
DOIs	https://doi.org/10.1109/ETW.2003.1231680
Publication status	Published - 2003

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@inproceedings{857a6078cda04d049508992d5539b9b3,

title = "Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]",

author = "T. Ostermann and B. Deutschmann",

year = "2003",

doi = "10.1109/ETW.2003.1231680",

language = "undefiniert/unbekannt",

isbn = "15581780 15301877",

booktitle = "Proceedings of the European Test Workshop",

}

TY - GEN

T1 - Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission]

AU - Ostermann, T.

AU - Deutschmann, B.

PY - 2003

Y1 - 2003

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84942880739&partnerID=MN8TOARS

U2 - 10.1109/ETW.2003.1231680

DO - 10.1109/ETW.2003.1231680

M3 - Beitrag in einem Konferenzband

SN - 15581780 15301877

BT - Proceedings of the European Test Workshop

ER -