At-line validation of optical coherence tomography as in-line/at-line coating thickness measurement method

Matthias Wolfgang, Anna Peter, Patrick Wahl, Daniel Markl, J. Axel Zeitler, Johannes G. Khinast

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
JournalInternational Journal of Pharmaceutics
Volume572
DOIs
Publication statusPublished - 15 Dec 2019

Keywords

  • Optical coherence tomography (OCT)
  • Terahertz pulsed imaging (TPI)
  • X-ray micro computed tomography (X mu CT)
  • Reference material
  • Coating thickness variability

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