Active Sampling via Tracking

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification
PublisherInstitute of Electrical and Electronics Engineers
Pages1-8
ISBN (Print)978-1-4244-2339-2
DOIs
Publication statusPublished - 2008
EventIEEE Workshop on Online Learning for Classification (OLC) - Anchorage, Alaska, United States
Duration: 24 Jun 200826 Jun 2008

Conference

ConferenceIEEE Workshop on Online Learning for Classification (OLC)
CountryUnited States
CityAnchorage, Alaska
Period24/06/0826/06/08

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Roth, P., & Bischof, H. (2008). Active Sampling via Tracking. In Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification (pp. 1-8). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CVPRW.2008.4563069

Active Sampling via Tracking. / Roth, Peter; Bischof, Horst.

Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification. Institute of Electrical and Electronics Engineers, 2008. p. 1-8.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Roth, P & Bischof, H 2008, Active Sampling via Tracking. in Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification. Institute of Electrical and Electronics Engineers, pp. 1-8, IEEE Workshop on Online Learning for Classification (OLC), Anchorage, Alaska, United States, 24/06/08. https://doi.org/10.1109/CVPRW.2008.4563069
Roth P, Bischof H. Active Sampling via Tracking. In Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification. Institute of Electrical and Electronics Engineers. 2008. p. 1-8 https://doi.org/10.1109/CVPRW.2008.4563069
Roth, Peter ; Bischof, Horst. / Active Sampling via Tracking. Proceedings of the CVPR 2008 Workshop IEEE Online Learning for Classification. Institute of Electrical and Electronics Engineers, 2008. pp. 1-8
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