A methodology to generate a time-varying adjustable wave impedance inside a TEM cell

Guanghua Li, V. A.K. Prabhala, Abhinav Saxena, Qian Wang, Pratik Maheshwari, David Pommerenke

Research output: Contribution to journalConference article

Abstract

A methodology to generate a time-varying adjustable wave impedances inside a TEM cell is introduced for electromagnetic susceptibility tests of small electronic modules. The TEM cell is excited by two amplified arbitrary waveforms. By varying the excitation waveforms and their timing, the momentary wave impedance and field strength inside the TEM cell can be adjusted.

Original languageEnglish
Article number6899094
Pages (from-to)894-898
Number of pages5
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2014-September
Issue numberSeptember
DOIs
Publication statusPublished - 15 Sep 2014
Externally publishedYes
Event2014 IEEE International Symposium on Electromagnetic Compatibility, EMC 2014 - Raleigh, United States
Duration: 3 Aug 20148 Aug 2014

Keywords

  • Arbitrary waveform
  • broadband amplifiers
  • susceptibility test
  • TEM cell
  • wave impedance

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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