Abstract
A methodology to generate a time-varying adjustable wave impedances inside a TEM cell is introduced for electromagnetic susceptibility tests of small electronic modules. The TEM cell is excited by two amplified arbitrary waveforms. By varying the excitation waveforms and their timing, the momentary wave impedance and field strength inside the TEM cell can be adjusted.
Original language | English |
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Title of host publication | 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) |
Pages | 894-898 |
Number of pages | 5 |
DOIs | |
Publication status | Published - 15 Sept 2014 |
Externally published | Yes |
Event | 2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, United States Duration: 3 Aug 2014 → 8 Aug 2014 |
Conference
Conference | 2014 IEEE International Symposium on Electromagnetic Compatibility |
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Country/Territory | United States |
City | Raleigh |
Period | 3/08/14 → 8/08/14 |
Keywords
- Arbitrary waveform
- broadband amplifiers
- susceptibility test
- TEM cell
- wave impedance
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering