A Generic and Robust Approach for the Analysis of Spot Array Images

N. Brändle, Horst Bischof, H. Lapp

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroarrays: Optical Technologies and Informatics
EditorsMichael L. Bittner
Place of PublicationBellingham, Wash.
PublisherSPIE
Pages1-12
Volume4266
ISBN (Print)0-8194-3944-4
Publication statusPublished - 2001

Publication series

NameSPIE proceedings series
PublisherSPIE

Cite this

Brändle, N., Bischof, H., & Lapp, H. (2001). A Generic and Robust Approach for the Analysis of Spot Array Images. In M. L. Bittner (Ed.), Microarrays: Optical Technologies and Informatics (Vol. 4266, pp. 1-12). (SPIE proceedings series). Bellingham, Wash.: SPIE.

A Generic and Robust Approach for the Analysis of Spot Array Images. / Brändle, N.; Bischof, Horst; Lapp, H.

Microarrays: Optical Technologies and Informatics. ed. / Michael L. Bittner. Vol. 4266 Bellingham, Wash. : SPIE, 2001. p. 1-12 (SPIE proceedings series).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Brändle, N, Bischof, H & Lapp, H 2001, A Generic and Robust Approach for the Analysis of Spot Array Images. in ML Bittner (ed.), Microarrays: Optical Technologies and Informatics. vol. 4266, SPIE proceedings series, SPIE, Bellingham, Wash., pp. 1-12.
Brändle N, Bischof H, Lapp H. A Generic and Robust Approach for the Analysis of Spot Array Images. In Bittner ML, editor, Microarrays: Optical Technologies and Informatics. Vol. 4266. Bellingham, Wash.: SPIE. 2001. p. 1-12. (SPIE proceedings series).
Brändle, N. ; Bischof, Horst ; Lapp, H. / A Generic and Robust Approach for the Analysis of Spot Array Images. Microarrays: Optical Technologies and Informatics. editor / Michael L. Bittner. Vol. 4266 Bellingham, Wash. : SPIE, 2001. pp. 1-12 (SPIE proceedings series).
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