A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages151-156
Publication statusPublished - 2005

Fields of Expertise

  • Sonstiges

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