A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages151-156
Publication statusPublished - 2005

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B. (2005). A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits. In International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 151-156). ..

A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits. / Deutschmann, Bernd.

International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., 2005. p. 151-156.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Deutschmann, B 2005, A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits. in International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., pp. 151-156.
Deutschmann B. A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits. In International Workshop on Electromagnetic Compatibility of Integrated Circuits. . 2005. p. 151-156
Deutschmann, Bernd. / A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits. International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., 2005. pp. 151-156
@inproceedings{26d1a6b12c72447baabecd6e1992a097,
title = "A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits",
author = "Bernd Deutschmann",
year = "2005",
language = "English",
pages = "151--156",
booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",
publisher = ".",

}

TY - GEN

T1 - A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits

AU - Deutschmann, Bernd

PY - 2005

Y1 - 2005

M3 - Conference contribution

SP - 151

EP - 156

BT - International Workshop on Electromagnetic Compatibility of Integrated Circuits

PB - .

ER -