Project Details
Description
The AIM project plans on the development of a novel high-speed AFM for integration into a state-of-the-art Triple-Ion Microscopes. The combination of novel self-sensing cantilevers for high-speed imaging and a highly compact scanner design will enable seamless integration into the very-high-vacuum environment without restricting inherent Triple-Ion microscope operation. This AIM microscope will combine the strengths of the two different imaging techniques, which allows entirely new correlative analysis for a broad range of in-situ applications at (sub)-nanometer scale.
Status | Finished |
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Effective start/end date | 1/08/17 → 28/02/20 |
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