Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems

Tobias Rauter, Andrea Höller, Johannes Iber, Christian Josef Kreiner

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
Titel2016 Euromicro Conference on Digital System Design (DSD)
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
DOIs
PublikationsstatusVeröffentlicht - 2016

Schlagwörter

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    Rauter, T., Höller, A., Iber, J., & Kreiner, C. J. (2016). Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems. in 2016 Euromicro Conference on Digital System Design (DSD) Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DSD.2016.13

    Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems. / Rauter, Tobias; Höller, Andrea; Iber, Johannes; Kreiner, Christian Josef.

    2016 Euromicro Conference on Digital System Design (DSD) . Institute of Electrical and Electronics Engineers, 2016.

    Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

    Rauter, T, Höller, A, Iber, J & Kreiner, CJ 2016, Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems. in 2016 Euromicro Conference on Digital System Design (DSD) . Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DSD.2016.13
    Rauter T, Höller A, Iber J, Kreiner CJ. Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems. in 2016 Euromicro Conference on Digital System Design (DSD) . Institute of Electrical and Electronics Engineers. 2016 https://doi.org/10.1109/DSD.2016.13
    Rauter, Tobias ; Höller, Andrea ; Iber, Johannes ; Kreiner, Christian Josef. / Using Model-Based Testing for Manufacturing and Integration-Testing of Embedded Control Systems. 2016 Euromicro Conference on Digital System Design (DSD) . Institute of Electrical and Electronics Engineers, 2016.
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    author = "Tobias Rauter and Andrea H{\"o}ller and Johannes Iber and Kreiner, {Christian Josef}",
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    AU - Höller, Andrea

    AU - Iber, Johannes

    AU - Kreiner, Christian Josef

    PY - 2016

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    KW - Testing

    KW - Manufacturing processes

    KW - Software

    KW - Hardware

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