The use of maximum entropy and bayesian techniques in nuclear microprobe applications

V. M. Prozesky, J. Padayachee, R. Fischer, W. Von Der Linden, V. Dose, C. G. Ryan

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
Originalspracheenglisch
Titel5th International Conference (Santa Fe, New Mexico),on Nuclear Microprobe Technology and Applications
ErscheinungsortSanta Fe
Herausgeber (Verlag)North-Holland Publ Co
Seiten595-598
Seitenumfang4
Band392
DOIs
PublikationsstatusVeröffentlicht - 1996
Extern publiziertJa

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