@inproceedings{5ea88fc701454ac5afc5d4a3acab893d,
title = "Prediction of Electrostatic Discharge (ESD) soft error on two-way radio using ESD simulation in CST and ESD immunity scanning technique",
abstract = "Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-Average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-And-error procedure.",
author = "Rosnah Antong and Danny Low and David Pommerenke and Abdullah, {Mohd Zaid}",
year = "2015",
month = jun,
day = "12",
doi = "10.1109/IEMT.2014.7123098",
language = "English",
series = "Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium",
publisher = "Institute of Electrical and Electronics Engineers",
booktitle = "2014 IEEE 36th International Electronics Manufacturing Technology Conference, IEMT 2014",
address = "United States",
note = "36th IEEE International Electronics Manufacturing Technology Conference : IEMT 2014 ; Conference date: 11-11-2014 Through 13-11-2014",
}