TY - GEN
T1 - ESD current spread measurement using mesh structure
AU - Lim, Jae Deok
AU - Pommerenke, David
AU - Lee, Jong Sung
AU - Seol, Byong Su
PY - 2009/4/16
Y1 - 2009/4/16
N2 - If a PCB is struck by an ESD the injected current spreads throughout the PCB and returns via attached cables. During the current spread a variety of effects occur: The current spreads on the main ground and power planes, couples into traces and IC lead-frames and bond wires. Further, the PCB and the attached cables can form resonators causing ringing at their natural resonance frequencies. Understanding the current spread onto a PCB, best, also onto the traces is of great importance for gaining insight into ESD related problems on products. A test setup has been created that allows capturing and quantifying the spreading current. It is a mesh like structure above a ground plane. The current in each trace of the mesh can be measured via the magnetic field allowing to analyze the magnitude of the current for complete mesh or slotted mesh structures. Additionally, Current-probe was designed though the process of measuring the current waveform.
AB - If a PCB is struck by an ESD the injected current spreads throughout the PCB and returns via attached cables. During the current spread a variety of effects occur: The current spreads on the main ground and power planes, couples into traces and IC lead-frames and bond wires. Further, the PCB and the attached cables can form resonators causing ringing at their natural resonance frequencies. Understanding the current spread onto a PCB, best, also onto the traces is of great importance for gaining insight into ESD related problems on products. A test setup has been created that allows capturing and quantifying the spreading current. It is a mesh like structure above a ground plane. The current in each trace of the mesh can be measured via the magnetic field allowing to analyze the magnitude of the current for complete mesh or slotted mesh structures. Additionally, Current-probe was designed though the process of measuring the current waveform.
UR - http://www.scopus.com/inward/record.url?scp=64249083598&partnerID=8YFLogxK
U2 - 10.1109/EMCZUR.2009.4783441
DO - 10.1109/EMCZUR.2009.4783441
M3 - Conference paper
AN - SCOPUS:64249083598
SN - 9783952328668
T3 - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
SP - 265
EP - 268
BT - Proceedings of the 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009
T2 - 20th International Zurich Symposium on Electromagnetic Compatibility
Y2 - 12 January 2009 through 16 January 2009
ER -