The development of safety-critical distributed embedded systems requires
adequate testing methods to ensure a low failure rate of the system.
Within this project it is the goal to develop a testing framework for
safety-critical distributed embedded systems that may have both,
event-triggered and time-triggered behavior. As the primary application
domain of this framework is the automotive industry, the framework will
support the V-model for software development.
To ensure a sufficient quality of the generated test data, a correlation
between the safety-requirements for the safety-integrity levels (SIL) of
the standard IEC 65108 and adequate test suites has to be defined.
The testing framework should generate the test cases automatically.
Therefore, a formal specification of the application is required. Finding
an adequate formal specification language that matches the required
expressiveness for the intended application domain will be an important
prerequisite for the development of the test case generation techniques.
Since this testing framework is targeted to real time embedded systems the
underlying formal techniques for test case generation will support a
precise notion of time in the application model. The testing framework
will support multiple test techniques to provide efficient techniques for
different abstraction levels.