X-rays to study, induce, and pattern structures in sol-gel materials

Paolo Falcaro, Plinio Innocenzi

Research output: Contribution to journalArticleResearchpeer-review

Abstract

X-rays investigations have been shown to reveal important information regarding material features and the formation mechanism of mesostructured materials. Small angle X-ray scattering (SAXS) analysis performed using a synchrotron source has been very important in the optimization of the organization of mesoporous coatings obtained by evaporation induced self-assembly (EISA). The interaction between X-rays and ordered mesoporous films has only recently been reported, and new knowledge has been developed to use this external radiation source to tune the local material properties. Here we discuss the recent developments in X-ray lithography combined with sol-gel synthesis to pattern mesostructured and hierarchical porous coatings including the ability to tailor functionalized surfaces.

Original languageEnglish
Pages (from-to)236-244
Number of pages9
JournalJournal of sol gel science and technology
Volume57
Issue number3
DOIs
Publication statusPublished - Mar 2011
Externally publishedYes

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Keywords

  • DXRL
  • Lithography
  • Mesoporous
  • Microarray
  • Microelectronic
  • Microfluidic
  • Patterning
  • SAXS
  • Sol-gel
  • Surface functionalisation
  • Synchrotron
  • Thin films
  • X-ray

ASJC Scopus subject areas

  • Chemistry(all)
  • Biomaterials
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics

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