X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films

Gabin Gbabode; Michael Dohr; Claude Niebel; Jean-Yves Balandier; Christian Ruzié; Philippe Négrier; Denise Mondieig; Yves H. Geerts; Roland Resel; Michele Sferrazza

doi:10.1021/am5015315

X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films

Gabin Gbabode, Michael Dohr, Claude Niebel, Jean-Yves Balandier, Christian Ruzié, Philippe Négrier, Denise Mondieig, Yves H. Geerts, Roland Resel, Michele Sferrazza

Institute of Solid State Physics (5130)

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	13413-13421
Journal	ACS Applied Materials & Interfaces
Volume	6
DOIs	https://doi.org/10.1021/am5015315
Publication status	Published - 2014

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1021/am5015315

Cite this

Gbabode, G., Dohr, M., Niebel, C., Balandier, J-Y., Ruzié, C., Négrier, P., ... Sferrazza, M. (2014). X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films. ACS Applied Materials & Interfaces, 6, 13413-13421. https://doi.org/10.1021/am5015315

X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films. / Gbabode, Gabin; Dohr, Michael; Niebel, Claude; Balandier, Jean-Yves; Ruzié, Christian; Négrier, Philippe; Mondieig, Denise; Geerts, Yves H.; Resel, Roland; Sferrazza, Michele.

In: ACS Applied Materials & Interfaces, Vol. 6, 2014, p. 13413-13421.

Research output: Contribution to journal › Article › Research › peer-review

Gbabode, G, Dohr, M, Niebel, C, Balandier, J-Y, Ruzié, C, Négrier, P, Mondieig, D, Geerts, YH, Resel, R & Sferrazza, M 2014, 'X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films' ACS Applied Materials & Interfaces, vol. 6, pp. 13413-13421. https://doi.org/10.1021/am5015315

Gbabode, Gabin ; Dohr, Michael ; Niebel, Claude ; Balandier, Jean-Yves ; Ruzié, Christian ; Négrier, Philippe ; Mondieig, Denise ; Geerts, Yves H. ; Resel, Roland ; Sferrazza, Michele. / X-ray structural investigation of nonsymmetrically and symmetrically alkylated [1]benzothieno[3,2-b]benzothiophene derivatives in bulk and thin films. In: ACS Applied Materials & Interfaces. 2014 ; Vol. 6. pp. 13413-13421.

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AU - Gbabode, Gabin

AU - Dohr, Michael

AU - Niebel, Claude

AU - Balandier, Jean-Yves

AU - Ruzié, Christian

AU - Négrier, Philippe

AU - Mondieig, Denise

AU - Geerts, Yves H.

AU - Resel, Roland

AU - Sferrazza, Michele

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JF - ACS Applied Materials & Interfaces

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