X-ray sectrometry in SEM and elements of the first transition series

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationElectron microscopy and analysis 1999
Place of PublicationBristol
PublisherIOP Publishing
Pages123-126
Volume161
Publication statusPublished - 1999
EventInstitute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, United Kingdom
Duration: 24 Aug 199927 Aug 1999

Publication series

NameInstitute of Physics conference series
PublisherIOP Publ.

Conference

ConferenceInstitute of Physics Electron Microscopy and Analysis Group Conference
CountryUnited Kingdom
CitySheffield
Period24/08/9927/08/99

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Pölt, P. (1999). X-ray sectrometry in SEM and elements of the first transition series. In Electron microscopy and analysis 1999 (Vol. 161, pp. 123-126). (Institute of Physics conference series). Bristol: IOP Publishing.