X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Armin Moser, Tatjana Djuric, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Research output: Contribution to conferencePoster

Original languageGerman
Publication statusPublished - 2011
EventE-MRS 2011 Spring & Bilateral Meeting - Nizza, Frankreich
Duration: 9 May 201113 May 2011

Conference

ConferenceE-MRS 2011 Spring & Bilateral Meeting
CityNizza, Frankreich
Period9/05/1113/05/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Neuhold, A., Novak, J., Flesch, H-G., Moser, A., Djuric, T., Grigorian, S., ... Resel, R. (2011). X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments. Poster session presented at E-MRS 2011 Spring & Bilateral Meeting, Nizza, Frankreich, .