X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold; Jiri Novak; Heinz-Georg Flesch; Armin Moser; Tatjana Djuric; Souren Grigorian; Linda Grodd; Ulrich Pietsch; Roland Resel

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Armin Moser, Tatjana Djuric, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Research output: Contribution to conference › Poster

Original language	German
Publication status	Published - 2011
Event	European Materials Research Society Spring Meeting 2011: E-MRS Spring Meeting 2011 - Nizza, France Duration: 9 May 2011 → 13 May 2011

Conference

Conference	European Materials Research Society Spring Meeting 2011
Abbreviated title	EMRS Spring Meeting 2011
Country/Territory	France
City	Nizza
Period	9/05/11 → 13/05/11
Other	E-MRS Spring & Bilateral Meeting

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
Application
Experimental

Cite this

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title = "X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments",

author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Armin Moser and Tatjana Djuric and Souren Grigorian and Linda Grodd and Ulrich Pietsch and Roland Resel",

year = "2011",

language = "deutsch",

note = "European Materials Research Society Spring Meeting 2011 ; Conference date: 09-05-2011 Through 13-05-2011",

}

TY - CONF

T1 - X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

AU - Neuhold, Alfred

AU - Novak, Jiri

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Djuric, Tatjana

AU - Grigorian, Souren

AU - Grodd, Linda

AU - Pietsch, Ulrich

AU - Resel, Roland

PY - 2011

Y1 - 2011

UR - http://www.emrs-strasbourg.com/index.php?option=com_content&task=view&id=359&Itemid=134

M3 - Poster

T2 - European Materials Research Society Spring Meeting 2011

Y2 - 9 May 2011 through 13 May 2011

ER -

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Other files and links

Cite this