X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Armin Moser, Tatjana Djuric, Linda Grodd, Souren Grigorian, Ulrich Pietsch, Roland Resel

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)64-68
JournalNuclear instruments & methods in physics research / B
Volume284
DOIs
Publication statusPublished - 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

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