X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold; Jiri Novak; Heinz-Georg Flesch; Armin Moser; Tatjana Djuric; Linda Grodd; Souren Grigorian; Ulrich Pietsch; Roland Resel

doi:10.1016/j.nimb.2011.07.105

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Armin Moser, Tatjana Djuric, Linda Grodd, Souren Grigorian, Ulrich Pietsch, Roland Resel

Institute of Solid State Physics (5130)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	64-68
Journal	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume	284
DOIs	https://doi.org/10.1016/j.nimb.2011.07.105
Publication status	Published - 2012

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
Application
Experimental

Access to Document

10.1016/j.nimb.2011.07.105

Cite this

Neuhold, A., Novak, J., Flesch, H-G., Moser, A., Djuric, T., Grodd, L., Grigorian, S., Pietsch, U., & Resel, R. (2012). X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , 284, 64-68. https://doi.org/10.1016/j.nimb.2011.07.105

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments. / Neuhold, Alfred; Novak, Jiri; Flesch, Heinz-Georg et al.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , Vol. 284, 2012, p. 64-68.

Research output: Contribution to journal › Article › peer-review

Neuhold, A, Novak, J, Flesch, H-G, Moser, A, Djuric, T, Grodd, L, Grigorian, S, Pietsch, U & Resel, R 2012, 'X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , vol. 284, pp. 64-68. https://doi.org/10.1016/j.nimb.2011.07.105

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title = "X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments",

author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Armin Moser and Tatjana Djuric and Linda Grodd and Souren Grigorian and Ulrich Pietsch and Roland Resel",

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language = "English",

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T1 - X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

AU - Neuhold, Alfred

AU - Novak, Jiri

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Djuric, Tatjana

AU - Grodd, Linda

AU - Grigorian, Souren

AU - Pietsch, Ulrich

AU - Resel, Roland

PY - 2012

Y1 - 2012

UR - http://www.sciencedirect.com/science/article/pii/S0168583X11007579#FCANote

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DO - 10.1016/j.nimb.2011.07.105

M3 - Article

SN - 1872-9584

VL - 284

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EP - 68

JO - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

ER -

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

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Cite this