X-ray Diffraction Study of Anthracene under High Pressure

Martin Oehzelt, Roland Resel, K. Hummer, P. Puschnig, C. Ambrosch-Draxl, A. Nakayama

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)913-914
JournalSynthetic metals
Volume137
Issue number1-3
Publication statusPublished - 2003

Cite this

Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Ambrosch-Draxl, C., & Nakayama, A. (2003). X-ray Diffraction Study of Anthracene under High Pressure. Synthetic metals, 137(1-3), 913-914.