X-ray diffraction line broadening in thin layers of quaterphenyl on C-covered gold(111)

Martin Oehzelt, Stefan Müllegger, Adolf Winkler, G. Hlawacek, C. Teichert, Roland Resel

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)155-7
JournalMaterials structure in chemistry, biology, physics and technology
Volume11
Issue number1a
Publication statusPublished - 2004

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

X-ray diffraction line broadening in thin layers of quaterphenyl on C-covered gold(111). / Oehzelt, Martin; Müllegger, Stefan; Winkler, Adolf; Hlawacek, G.; Teichert, C.; Resel, Roland.

In: Materials structure in chemistry, biology, physics and technology, Vol. 11, No. 1a, 2004, p. 155-7.

Research output: Contribution to journalArticleResearch

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AU - Oehzelt, Martin

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AU - Winkler, Adolf

AU - Hlawacek, G.

AU - Teichert, C.

AU - Resel, Roland

PY - 2004

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JO - Materials structure in chemistry, biology, physics and technology

JF - Materials structure in chemistry, biology, physics and technology

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