X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111)

Martin Oehzelt, Stefan Muellegger, Adolf Winkler, Gregor Hlawacek, Christian Teichert, Roland Resel

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the EPDIC-9
Publisher.
Pages1-1
Publication statusPublished - 2004

Cite this

Oehzelt, M., Muellegger, S., Winkler, A., Hlawacek, G., Teichert, C., & Resel, R. (2004). X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111). In Proceedings of the EPDIC-9 (pp. 1-1). ..

X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111). / Oehzelt, Martin; Muellegger, Stefan; Winkler, Adolf; Hlawacek, Gregor; Teichert, Christian; Resel, Roland.

Proceedings of the EPDIC-9. ., 2004. p. 1-1.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Oehzelt, M, Muellegger, S, Winkler, A, Hlawacek, G, Teichert, C & Resel, R 2004, X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111). in Proceedings of the EPDIC-9. ., pp. 1-1.
Oehzelt M, Muellegger S, Winkler A, Hlawacek G, Teichert C, Resel R. X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111). In Proceedings of the EPDIC-9. . 2004. p. 1-1
Oehzelt, Martin ; Muellegger, Stefan ; Winkler, Adolf ; Hlawacek, Gregor ; Teichert, Christian ; Resel, Roland. / X-ray diffraction line broadening in thin film layers of p-quaterphenyl on C-covered gold(111). Proceedings of the EPDIC-9. ., 2004. pp. 1-1
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