X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold, Hannes Brandner, Simon Außerlechner, Stefan Lorbek, Markus Neuschitzer, Egbert Zojer, Christian Teichert, Roland Resel

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)479-487
JournalOrganic electronics
Volume14
DOIs
Publication statusPublished - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

X-ray based tools for the investigation of buried interfaces in organic electronic devices. / Neuhold, Alfred; Brandner, Hannes; Außerlechner, Simon; Lorbek, Stefan; Neuschitzer, Markus; Zojer, Egbert; Teichert, Christian; Resel, Roland.

In: Organic electronics, Vol. 14, 2013, p. 479-487.

Research output: Contribution to journalArticleResearchpeer-review

Neuhold, Alfred ; Brandner, Hannes ; Außerlechner, Simon ; Lorbek, Stefan ; Neuschitzer, Markus ; Zojer, Egbert ; Teichert, Christian ; Resel, Roland. / X-ray based tools for the investigation of buried interfaces in organic electronic devices. In: Organic electronics. 2013 ; Vol. 14. pp. 479-487.
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AU - Neuhold, Alfred

AU - Brandner, Hannes

AU - Außerlechner, Simon

AU - Lorbek, Stefan

AU - Neuschitzer, Markus

AU - Zojer, Egbert

AU - Teichert, Christian

AU - Resel, Roland

PY - 2013

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U2 - 10.1016/j.orgel.2012.11.016

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EP - 487

JO - Organic electronics

JF - Organic electronics

SN - 1566-1199

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