Windows Detection using K-Means in CIE-LAB Color Space

Michal Récky; Franz Leberl

doi:10.1109/ICPR.2010.96

Windows Detection using K-Means in CIE-LAB Color Space

Institute of Computer Graphics and Vision (7100)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings for ICPR 2010
Place of Publication	Piscataway, NY
Publisher	Institute of Electrical and Electronics Engineers
Pages	356-360
ISBN (Print)	978-0-7695-4109-9
DOIs	https://doi.org/10.1109/ICPR.2010.96
Publication status	Published - 2010
Event	20th International Conference on Pattern Recognition: ICPR 2010 - Istanbul, Turkey Duration: 23 Aug 2010 → 26 Aug 2010

Conference

Conference	20th International Conference on Pattern Recognition
Abbreviated title	ICPR'10
Country/Territory	Turkey
City	Istanbul
Period	23/08/10 → 26/08/10

Fields of Expertise

Sonstiges

Access to Document

10.1109/ICPR.2010.96

304 - ICPR-2010, Recky.pdfSubmitted manuscript, 340 KB

Doctoral Program: Confluence of Vision and Graphics
Zangl, K., Fellner, W., Klopschitz, M., Leberl, F., Pinz, A., Schmalstieg, D., Aurenhammer, F., Bauer, C., Schiffer, T., Demuth, M., Recky, M. & Bischof, H.
1/06/07 → 30/04/11
Project: Research project

Cite this

@inproceedings{82af052b7ef94cb5b90de325e85f65b0,

title = "Windows Detection using K-Means in CIE-LAB Color Space",

author = "Michal R{\'e}cky and Franz Leberl",

year = "2010",

doi = "10.1109/ICPR.2010.96",

language = "English",

isbn = "978-0-7695-4109-9",

pages = "356--360",

booktitle = "Proceedings for ICPR 2010",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "20th International Conference on Pattern Recognition : ICPR 2010, ICPR'10 ; Conference date: 23-08-2010 Through 26-08-2010",

}

TY - GEN

T1 - Windows Detection using K-Means in CIE-LAB Color Space

AU - Récky, Michal

AU - Leberl, Franz

PY - 2010

Y1 - 2010

U2 - 10.1109/ICPR.2010.96

DO - 10.1109/ICPR.2010.96

M3 - Conference paper

SN - 978-0-7695-4109-9

SP - 356

EP - 360

BT - Proceedings for ICPR 2010

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway, NY

T2 - 20th International Conference on Pattern Recognition

Y2 - 23 August 2010 through 26 August 2010

ER -

Windows Detection using K-Means in CIE-LAB Color Space

Conference

Fields of Expertise

Access to Document

Projects

Doctoral Program: Confluence of Vision and Graphics

Cite this