Windows Detection using K-Means in CIE-LAB Color Space

Michal Récky, Franz Leberl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings for ICPR 2010
Place of PublicationPiscataway, NY
PublisherInstitute of Electrical and Electronics Engineers
Pages356-360
ISBN (Print)978-0-7695-4109-9
DOIs
Publication statusPublished - 2010
Event20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey
Duration: 23 Aug 201026 Aug 2010

Conference

Conference20th International Conference on Pattern Recognition (ICPR)
CountryTurkey
CityIstanbul
Period23/08/1026/08/10

Fields of Expertise

  • Sonstiges

Cite this

Récky, M., & Leberl, F. (2010). Windows Detection using K-Means in CIE-LAB Color Space. In Proceedings for ICPR 2010 (pp. 356-360). Piscataway, NY: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICPR.2010.96

Windows Detection using K-Means in CIE-LAB Color Space. / Récky, Michal; Leberl, Franz.

Proceedings for ICPR 2010. Piscataway, NY : Institute of Electrical and Electronics Engineers, 2010. p. 356-360.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Récky, M & Leberl, F 2010, Windows Detection using K-Means in CIE-LAB Color Space. in Proceedings for ICPR 2010. Institute of Electrical and Electronics Engineers, Piscataway, NY, pp. 356-360, 20th International Conference on Pattern Recognition (ICPR), Istanbul, Turkey, 23/08/10. https://doi.org/10.1109/ICPR.2010.96
Récky M, Leberl F. Windows Detection using K-Means in CIE-LAB Color Space. In Proceedings for ICPR 2010. Piscataway, NY: Institute of Electrical and Electronics Engineers. 2010. p. 356-360 https://doi.org/10.1109/ICPR.2010.96
Récky, Michal ; Leberl, Franz. / Windows Detection using K-Means in CIE-LAB Color Space. Proceedings for ICPR 2010. Piscataway, NY : Institute of Electrical and Electronics Engineers, 2010. pp. 356-360
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