Walking through a Virtual City by Thought

Robert Leeb, Gert Pfurtscheller

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

    Original languageEnglish
    Title of host publicationProceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
    Place of PublicationPiscataway, NJ, USA
    PublisherInstitute of Electrical and Electronics Engineers
    Pages4503-4506
    ISBN (Print)0-7803-8439-3
    Publication statusPublished - 2004

    Cite this

    Leeb, R., & Pfurtscheller, G. (2004). Walking through a Virtual City by Thought. In Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (pp. 4503-4506). Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers.

    Walking through a Virtual City by Thought. / Leeb, Robert; Pfurtscheller, Gert.

    Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers, 2004. p. 4503-4506.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

    Leeb, R & Pfurtscheller, G 2004, Walking through a Virtual City by Thought. in Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Institute of Electrical and Electronics Engineers, Piscataway, NJ, USA, pp. 4503-4506.
    Leeb R, Pfurtscheller G. Walking through a Virtual City by Thought. In Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Piscataway, NJ, USA: Institute of Electrical and Electronics Engineers. 2004. p. 4503-4506
    Leeb, Robert ; Pfurtscheller, Gert. / Walking through a Virtual City by Thought. Proceedings of the 26th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers, 2004. pp. 4503-4506
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