Von der Blitzentladung bis zu ESD-Testverfahren: Beanspruchungen von Geräten und integrierten Schaltungen sowie normative Anforderungen

Translated title of the contribution: From the lightning discharge to ESD test methods: Stress effects to devices and integrated circuits with respect to the standards

Research output: Contribution to journalArticlepeer-review

Abstract

Electrical and electronic systems and information technology infrastructures are exposed to the influences and effects of atmospheric discharges. This paper examines the relationships between atmospheric discharges in connection with electrical systems, electronic devices and integrated circuits. A focus is put on the standards and test methods to ensure the electromagnetic compatibility against transient disturbances.
Translated title of the contributionFrom the lightning discharge to ESD test methods: Stress effects to devices and integrated circuits with respect to the standards
Original languageGerman
Pages (from-to)3-10
JournalElektrotechnik und Informationstechnik
Volume133
Issue number1
DOIs
Publication statusPublished - 2016

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