Abstract
Electrical and electronic systems and information technology infrastructures are exposed to the influences and effects of atmospheric discharges. This paper examines the relationships between atmospheric discharges in connection with electrical systems, electronic devices and integrated circuits. A focus is put on the standards and test methods to ensure the electromagnetic compatibility against transient disturbances.
Translated title of the contribution | From the lightning discharge to ESD test methods: Stress effects to devices and integrated circuits with respect to the standards |
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Original language | German |
Pages (from-to) | 3-10 |
Journal | Elektrotechnik und Informationstechnik |
Volume | 133 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2016 |