Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering

Tobias Schreck, Daniel A. Keim, Christian Panse

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationConference proceedings / ICME 2006
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers
Pages925-928
ISBN (Print)1-42440-367-7
DOIs
Publication statusPublished - 2006
Event2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Toronto, Canada
Duration: 9 Jul 200612 Jul 2006

Conference

Conference2006 IEEE International Conference on Multimedia and Expo, ICME 2006
CountryCanada
CityToronto
Period9/07/0612/07/06

Fields of Expertise

  • Sonstiges

Cite this

Schreck, T., Keim, D. A., & Panse, C. (2006). Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering. In Conference proceedings / ICME 2006 (pp. 925-928). Piscataway, NJ: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICME.2006.262671