Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering

Tobias Schreck, Daniel A. Keim, Christian Panse

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Conference proceedings / ICME 2006
Place of Publication	Piscataway, NJ
Publisher	Institute of Electrical and Electronics Engineers
Pages	925-928
ISBN (Print)	1-42440-367-7
DOIs	https://doi.org/10.1109/ICME.2006.262671
Publication status	Published - 2006
Event	2006 IEEE International Conference on Multimedia and Expo: ICME 2006 - Toronto, Canada Duration: 9 Jul 2006 → 12 Jul 2006

Conference	2006 IEEE International Conference on Multimedia and Expo
Country/Territory	Canada
City	Toronto
Period	9/07/06 → 12/07/06

Fields of Expertise

Schreck, T, Keim, DA & Panse, C 2006, Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering. in Conference proceedings / ICME 2006. Institute of Electrical and Electronics Engineers, Piscataway, NJ, pp. 925-928, 2006 IEEE International Conference on Multimedia and Expo, Toronto, Canada, 9/07/06. https://doi.org/10.1109/ICME.2006.262671

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title = "Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering",

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year = "2006",

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language = "English",

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pages = "925--928",

booktitle = "Conference proceedings / ICME 2006",

publisher = "Institute of Electrical and Electronics Engineers",

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note = "2006 IEEE International Conference on Multimedia and Expo : ICME 2006 ; Conference date: 09-07-2006 Through 12-07-2006",

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T1 - Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering

AU - Schreck, Tobias

AU - Keim, Daniel A.

AU - Panse, Christian

PY - 2006

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DO - 10.1109/ICME.2006.262671

M3 - Conference paper

SN - 1-42440-367-7

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EP - 928

BT - Conference proceedings / ICME 2006

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway, NJ

T2 - 2006 IEEE International Conference on Multimedia and Expo

Y2 - 9 July 2006 through 12 July 2006

ER -