Using Spectrum-based Fault Localization for Test Case Grouping

Martin Weiglhofer, Gordon Fraser, Franz Wotawa

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering
Publisher.
Pages630-634
Publication statusPublished - 2009
Event24th IEEE/ACM International Conference on Automated Software Engineering - Auckland, Neuseeland
Duration: 16 Nov 200920 Nov 2009

Conference

Conference24th IEEE/ACM International Conference on Automated Software Engineering
CityAuckland, Neuseeland
Period16/11/0920/11/09

Cite this

Weiglhofer, M., Fraser, G., & Wotawa, F. (2009). Using Spectrum-based Fault Localization for Test Case Grouping. In Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering (pp. 630-634). ..

Using Spectrum-based Fault Localization for Test Case Grouping. / Weiglhofer, Martin; Fraser, Gordon; Wotawa, Franz.

Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering. ., 2009. p. 630-634.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Weiglhofer, M, Fraser, G & Wotawa, F 2009, Using Spectrum-based Fault Localization for Test Case Grouping. in Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering. ., pp. 630-634, 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, 16/11/09.
Weiglhofer M, Fraser G, Wotawa F. Using Spectrum-based Fault Localization for Test Case Grouping. In Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering. . 2009. p. 630-634
Weiglhofer, Martin ; Fraser, Gordon ; Wotawa, Franz. / Using Spectrum-based Fault Localization for Test Case Grouping. Proceedings of the 24th IEEE/ACM International Conference on Automated Software Engineering. ., 2009. pp. 630-634
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