Using Spectrum-based Fault Localization for Test Case Grouping

Martin Weiglhofer

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2009
Event24th IEEE/ACM International Conference on Automated Software Engineering - Auckland, Neuseeland
Duration: 16 Nov 200920 Nov 2009

Conference

Conference24th IEEE/ACM International Conference on Automated Software Engineering
CityAuckland, Neuseeland
Period16/11/0920/11/09

Cite this

Weiglhofer, M. (2009). Using Spectrum-based Fault Localization for Test Case Grouping. Poster session presented at 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, .

Using Spectrum-based Fault Localization for Test Case Grouping. / Weiglhofer, Martin.

2009. Poster session presented at 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, .

Research output: Contribution to conferencePosterResearch

Weiglhofer, M 2009, 'Using Spectrum-based Fault Localization for Test Case Grouping' 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, 16/11/09 - 20/11/09, .
Weiglhofer M. Using Spectrum-based Fault Localization for Test Case Grouping. 2009. Poster session presented at 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, .
Weiglhofer, Martin. / Using Spectrum-based Fault Localization for Test Case Grouping. Poster session presented at 24th IEEE/ACM International Conference on Automated Software Engineering, Auckland, Neuseeland, .
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