Using Device Simulations to Optimize ESD Protection Circuits

B. Fankhauser, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Symposium on Electromagnetic Compatibility
Publisher.
Pages963-968
ISBN (Print)0-7803-8443-1
DOIs
Publication statusPublished - 2004
Event2004 IEEE International Symposium on Electromagnetic Compatibility: EMC 2004 - Santa Clara, United States
Duration: 9 Aug 200413 Aug 2004

Conference

Conference2004 IEEE International Symposium on Electromagnetic Compatibility
CountryUnited States
CitySanta Clara
Period9/08/0413/08/04

Fields of Expertise

  • Sonstiges

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