Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationAbstract MC 2019
Pages367
Publication statusPublished - 2019
EventMicroscopy Conference 2019 - Berlin, Germany
Duration: 1 Sep 20196 Sep 2019

Conference

ConferenceMicroscopy Conference 2019
Abbreviated titleMC 2019
CountryGermany
CityBerlin
Period1/09/196/09/19

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy. / Rattenberger, Johannes; Fitzek, Harald Matthias; Achtsnit, Tobias; Schröttner, Hartmuth; Hofer, Ferdinand.

Abstract MC 2019. 2019. p. 367.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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title = "Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy",
author = "Johannes Rattenberger and Fitzek, {Harald Matthias} and Tobias Achtsnit and Hartmuth Schr{\"o}ttner and Ferdinand Hofer",
year = "2019",
language = "English",
pages = "367",
booktitle = "Abstract MC 2019",

}

TY - GEN

T1 - Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy

AU - Rattenberger, Johannes

AU - Fitzek, Harald Matthias

AU - Achtsnit, Tobias

AU - Schröttner, Hartmuth

AU - Hofer, Ferdinand

PY - 2019

Y1 - 2019

M3 - Conference contribution

SP - 367

BT - Abstract MC 2019

ER -