Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy

Research output: Contribution to conferencePosterResearchpeer-review

Original languageEnglish
Publication statusPublished - 2019
EventMicroscopy Conference 2019 - Berlin, Germany
Duration: 1 Sep 20196 Sep 2019

Conference

ConferenceMicroscopy Conference 2019
Abbreviated titleMC 2019
CountryGermany
CityBerlin
Period1/09/196/09/19

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy. / Rattenberger, Johannes; Fitzek, Harald Matthias; Achtsnit, Tobias; Schröttner, Hartmuth; Hofer, Ferdinand.

2019. Poster session presented at Microscopy Conference 2019 , Berlin, Germany.

Research output: Contribution to conferencePosterResearchpeer-review

@conference{46dc757c5da24b7d984e8879924c13a7,
title = "Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy",
author = "Johannes Rattenberger and Fitzek, {Harald Matthias} and Tobias Achtsnit and Hartmuth Schr{\"o}ttner and Ferdinand Hofer",
year = "2019",
language = "English",
note = "Microscopy Conference 2019 , MC 2019 ; Conference date: 01-09-2019 Through 06-09-2019",

}

TY - CONF

T1 - Universal Pressure Scanning Electron Microscopy (UPSEM) - Improvements in Environmental Scanning Electron Microscopy

AU - Rattenberger, Johannes

AU - Fitzek, Harald Matthias

AU - Achtsnit, Tobias

AU - Schröttner, Hartmuth

AU - Hofer, Ferdinand

PY - 2019

Y1 - 2019

M3 - Poster

ER -