Universal pressure scanning electron microscopy (UPSEM) –electron microscopy from high vacuum to atmospheric pressure

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationMC2017
PagesIM1.012
Publication statusPublished - 2017
EventMicroscopy Conference 2017 - Lausanne, Switzerland
Duration: 21 Aug 201725 Aug 2017
http://www.mc2017.ch/

Conference

ConferenceMicroscopy Conference 2017
Abbreviated titleMC 2017
CountrySwitzerland
CityLausanne
Period21/08/1725/08/17
Internet address

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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