UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications

Manfred Sakulin, T. Key

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 20 Apr 1997
EventPQA ´97 - North America, Columbus
Duration: 20 Apr 1997 → …

Conference

ConferencePQA ´97
CityNorth America, Columbus
Period20/04/97 → …

Cite this

Sakulin, M., & Key, T. (1997). UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications. PQA ´97, North America, Columbus, .

UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications. / Sakulin, Manfred; Key, T.

1997. PQA ´97, North America, Columbus, .

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Sakulin, M & Key, T 1997, 'UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications' PQA ´97, North America, Columbus, 20/04/97, .
Sakulin, Manfred ; Key, T. / UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications. PQA ´97, North America, Columbus, .
@conference{5f0741cc874145ba804bf903dfd8295f,
title = "UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications",
author = "Manfred Sakulin and T. Key",
year = "1997",
month = "4",
day = "20",
language = "English",
note = "PQA ´97 ; Conference date: 20-04-1997",

}

TY - CONF

T1 - UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications

AU - Sakulin, Manfred

AU - Key, T.

PY - 1997/4/20

Y1 - 1997/4/20

M3 - (Old data) Lecture or Presentation

ER -