UIE/IEC Flickert Standard for Use in North America Measuring Techniques and Partical Applications

Manfred Sakulin, T. Key

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 20 Apr 1997
EventPQA ´97 - North America, Columbus
Duration: 20 Apr 1997 → …

Conference

ConferencePQA ´97
CityNorth America, Columbus
Period20/04/97 → …

Cite this